SNA5004A Διανυσματικός Αναλυτής Δικτύων 4.5 GHz

Κύρια Χαρακτηριστικά

• Frequency range: 9 kHz – 4.5 GHz
• Frequency resolution: 1 Hz
• Level resolution: 0.05 dB
• Range of IFBW: 10 Hz~3 MHz
• Setting range of output level: -55 dBm ~ +10 dBm
• Dynamic range: 125 dB
• Types of calibration: Response calibration, Enhanced Response calibration, Full-one port calibration, Full-two port calibration, Full-three port calibration, Full-four port calibration, TRL calibration
• Types of measurement: Scattering-parameter measurement, differential-parameter measurement, receiver measurement, time-domain parameter analysis, limit test, ripple test, impedance conversion, fixture simulation, adapter removal/insertion, spectrum analysis frequency offset, scalar mixer measurement
• Internal Bias-Tee connections
• Interface: LAN, USB Device, USB Host (USB-GPIB)
• Remote control: SCPI/ Labview/ IVI based on USB-TMC / VXI-11 / Socket /Telnet / WebServer
• 1-inch touch screen
• Video output: HDMI

Low noise floor for accurate measurements with a wide dynamic range

System Dynamic range, the difference between the measurement power available at the test port and the noise floor of the receiver is critical parameters of a VNA. The SIGLENT SNA5000A series’ dynamic range can up to 125 dB@10 Hz, satisfies some specific RF test requirements like test in-band and out-of-band of filters simultaneously.

S-parameters and Balance Measurement

For the 4 ports S-parameters measurement of SNA5000A, multi traces in different windows can be added, with the formats of Log Mag, Lin Mag, Phase, Delay, Smith, SWR, Polar, etc. It is helpful for transmission/ reflection tracking, load match, and directivity analysis. These traces can be saved as references or adding limits for pass/fail tests to improve the efficiency during the antennas test and filter test.

Enhanced Time-Domain Analysis (TDR)

SNA5000A supports Enhanced Time Domain Analysis to measure impedance versus distance, to distinguish between inductive and capacitive transitions. With time-domain gating, we can isolate various sections of the fixture and see the effects in the frequency domain. Another application for TDR is fault-location for coaxial cables in cellular and CATV installations.

Embedding and De-Embedding

There is a great challenge in RF & Microwave area to eliminate the harmful fixture effects effectively. In most cases, the test result contains the features of effect, because the specific effect connected the test terminal of instrument and input terminal of the device during SMD testing. The SNA5000A applied kinds of methods to minimum the effect caused by fixture effect, includes port extension, port matching, port impedance conversion, de-embedding, adapter removal, etc.

Calibration Kit

SIGLENT offers a variety of calibration kits with the frequency range from DC to 9 GHz for both general purpose and precision-level requirements. Each of the Cal kits from SIGELNT includes all of the necessary short circuits, open circuits, loads and thru (SOLT) components required for proper testing, with the connectors of SMA and N. Other electronics test equipment manufacturers Cal kits are available in SNA5000A series, and the importing of user-defined Cal kits are supported, saves the customers investment on calibration.

Large Display Small Footprint

The SNA5000A features a large touchscreen and user interface with a small footprint that makes it easy to use on the desktop and easier to move around the lab.

Παρελκόμενα

• Power Cord
  
• USB Cable
  
• Quick Start Guide
• Calibration Certificate
  
• Protective Cover
  
• Wireless Mouse